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Медицинское оборудование
Wafer Testing And Metrology
| WAFER TESTING AND METROLOGY |
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| Описание: |
Film thickness measurement system Can measure the thickness, n, k values and roughness up to 4 layers thin film stacks Semiconductor applications: Photo resist, SiO2, SiNx, etc LCD applications: Cell gaps, ITO , Polyimide Optical application: hard coating , anti-reflection coating , filters System includes the system, computer and software (disc) Calibration needed. |
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| Цена: | 0 $ | |
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